xis.ai offers a no‑code computer‑vision platform that automates the full AI lifecycle for industrial quality inspection, letting users import images, label data, train deep‑learning models, and deploy them to a lightweight edge runtime without writing code. The trained models run in real time on edge devices such as industrial cameras, microscopes, thermal cameras or X‑ray sensors, providing instant defect and anomaly detection for high‑speed manufacturing and logistics lines.
Funding
Funding not disclosed
Founders
Product
Problem
Manufacturers and logistics operators often rely on manual visual inspection or rule‑based machine vision systems to detect defects in products, packaging, and components. These approaches are slow, require specialist expertise, and struggle to keep up with high‑speed production lines, leading to missed defects, higher recall rates, and increased total cost of quality.
Solution
xis.ai provides a no‑code computer‑vision platform that automates the entire AI lifecycle for industrial quality inspection. Users import images, label data with AI‑assisted tools, train deep‑learning models for defect, anomaly, object‑detection or segmentation tasks, and test the models—all without writing code. Trained models are deployed to the lightweight xis Runtime, which can run on edge devices such as industrial cameras, microscopes, thermal cameras or X‑ray tubes, delivering real‑time inference directly on the production line. The platform includes a real‑time analytics dashboard, integration hooks for PLC/MES systems, and export options for various model architectures, enabling seamless incorporation into existing manufacturing or logistics workflows while reducing the need for AI specialists.
Target Audience
Primary customers are manufacturers, pharmaceutical producers, logistics and warehouse operators, and other industrial enterprises that need high‑speed, automated visual quality inspection across production lines.
Features
- AI‑assisted image labeling that accelerates dataset preparation for both supervised and unsupervised anomaly detection
- End‑to‑end pipeline (import, annotate, train, test, deploy) accessible through a no‑code web interface
- xis Runtime: lightweight edge runtime compatible with any industrial camera, microscope, thermal camera or X‑ray sensor for on‑device inference
- Real‑time analytics dashboard with performance metrics and actionable signals for PLC/MES integration
- Support for multiple inspection workflows (defect detection, object detection, image segmentation, print/label quality, carton damage, syringe inspection)
- Export of trained models in common formats for integration with custom hardware or third‑party systems
- Cloud‑hosted model performance analytics and continuous monitoring without requiring on‑site AI expertise