UNISERS develops universal liquid analyzers that utilize nanotechnology and Raman spectroscopy for precise chemical composition analysis. This technology enables real-time monitoring of liquid quality, ensuring compliance with industry standards and improving operational efficiency.
Funding
$14M raised to dateRaised to date based on public sources. This may differ from the amount the company actually raised and is based only on what is publicly available on the internet.
IFounders
Product
Problem
Semiconductor manufacturing processes are highly susceptible to contamination, leading to significant yield loss and increased production costs. Existing contamination control methods often lack the sensitivity and speed required to detect and characterize nanoscale particles effectively. Billions of dollars are lost annually due to ineffective contamination analysis during semiconductor manufacturing.
Solution
UNISERS provides advanced contamination analysis solutions for the semiconductor industry, enabling manufacturers to identify and characterize nanoscale contaminants on silicon wafers with high precision and speed. The company's technology utilizes a unique vacuum-based plasma coating to enhance the detection of contaminants, allowing for earlier identification and detailed characterization. By enabling faster identification of contamination sources, UNISERS helps manufacturers increase chip production yields, reduce waste, and achieve significant cost and time savings. The solution combines signal enhancement using plasma coating with state-of-the-art optical microscopy to identify and locate contaminants as small as 8nm.
Target Audience
The primary target audience includes semiconductor manufacturers seeking to improve chip production yields and reduce waste through more effective contamination control.
Features
- Vacuum-based plasma coating technology for signal enhancement of contaminants on surfaces
- High-sensitivity optical microscopy for detection and localization of nanoparticles down to 8nm
- Spectroscopic analysis to determine the size and type of particles
- Surface-enhanced Raman spectroscopy (SERS) to record the molecular fingerprint of individual nanoparticles
- Ability to detect contaminants on any type of wafer
- Streamlined workflow for faster contamination source identification