This company provides specialized in-circuit testing solutions for semiconductors, focusing on logic and memory. Their offerings help organizations improve productivity in integrated circuit design and testing.
Funding
Funding not disclosed
Founders
Product
Problem
The increasing density of integrated circuits, driven by shrinking feature sizes, leads to exponentially higher test application times (TAT) and associated costs, which can account for a significant portion of the total chip cost. Existing methods struggle to efficiently identify faults, requiring millions of test vectors and expensive automatic test equipment (ATE).
Solution
Spectral Chip Test Research offers a solution to reduce semiconductor test costs by optimizing the test vector generation process. Their patented algorithms iteratively create test conditions and desired operational responses, significantly reducing the number of tests required and the overall TAT. By focusing on identifying digital frequencies that expose the most faults, the method generates future vectors biased towards these frequencies, improving fault coverage with fewer vectors. This approach can be implemented as built-in self-testing (BIST) hardware within the chip itself, further enhancing cost savings.
Target Audience
The primary target market includes semiconductor companies in the automotive and defense industries seeking to reduce chip testing costs and improve the efficiency of their integrated circuit design and testing processes.
Features
- Patented algorithms for iterative test vector generation
- Random vector generation and analysis to identify fault-revealing digital frequencies
- Biased vector generation focusing on useful frequencies
- Potential for implementation as built-in self-testing (BIST) hardware
- Reduces test application time (TAT) by a claimed 64%
- Aims to achieve 100% stuck-at 0/1 fault coverage