Shinephi provides real-time, nanoscale optical metrology systems that attach to existing microscopes, enabling non-contact measurement of surface topography and refractive index changes with sub-nanometer vertical sensitivity. The technology uses lateral-shear interferometric microscopy to capture phase information at up to 50 frames per second, delivering quantitative 2D and 3D imaging for advanced manufacturing and research applications.
Funding
Funding not disclosed
Founders
Product
Problem
Conventional optical microscopes cannot reliably image structures thinner than λ/30, while atomic force microscopes (AFMs) only characterize limited areas and require slow, often destructive scanning. This forces research labs and manufacturers to choose between high sensitivity and large field of view, slowing down measurement cycles and reducing statistical confidence in nanoscale quality control.
Solution
Shinephi provides high-performance add-on imagers that connect directly to the output port of any existing microscope or imaging system, converting standard light into quantitative phase data. The technology uses lateral-shear interferometric microscopy (LIM) with linear polarizers, Savart plates, and proprietary phase-shifting algorithms to extract 2D and 3D holograms from samples. This approach delivers AFM-level detection sensitivity down to 0.1 nm vertical resolution while maintaining the versatility and speed of optical imaging, with acquisition rates up to 50 frames per second. The system is stabilization-free, compatible with LED and white light sources, and supports both reflection and transmission modes, enabling routine non-contact screening without damaging samples.
Target Audience
Primary customers are research laboratories, advanced manufacturing facilities, and system integrators needing high-speed, non-contact nanoscale metrology for quality control, materials characterization, and process monitoring.
Features
- Sub-nanometer vertical sensitivity down to 0.1 nm for detecting critical surface variations
- 5MP quantitative 2D/3D phase imaging with high-resolution hologram extraction
- Modular add-on architecture that upgrades existing microscopes without requiring new platforms
- Dual reflection and transmission modes for versatile sample characterization
- Stabilization-free operation with LED/white light compatibility for ease of use
- Up to 50 fps acquisition speed enabling real-time, high-throughput screening
- Mass-scalable production design for broad industrial deployment