QuantaMap offers a cryogenic‑compatible defect‑inspection platform that uses a SQUID‑on‑tip microscope to provide sub‑100 nm magnetic imaging of quantum chips at millikelvin temperatures. The system automatically detects and classifies defects, delivering actionable metrics that integrate with wafer‑handling workflows and manufacturing execution systems to improve yield for superconducting and spin‑based qubit manufacturers.
Funding
Funding not disclosed
Founders
Product
Problem
Quantum chip manufacturers lack a reliable, high‑resolution method to locate and characterize microscopic defects that cause qubit failure, making yield optimization and process control difficult. Existing metrology tools are either too invasive, lack the necessary sensitivity, or cannot operate under the cryogenic conditions required for quantum hardware. Consequently, production cycles are slowed by trial‑and‑error debugging.
Solution
QuantaMap provides a dedicated defect‑inspection platform built around an IP‑protected SQUID‑on‑tip microscope. The instrument delivers sub‑micron magnetic imaging at millikelvin temperatures, enabling direct visualization of current paths, flux pinning sites, and material inhomogeneities in superconducting and spin‑based quantum circuits. Integrated software automatically extracts defect metrics and correlates them with fabrication parameters, allowing engineers to pinpoint failure sources and iteratively improve process steps. The system is designed for cleanroom compatibility and can be incorporated into existing wafer‑handling workflows, reducing downtime between fabrication and testing. Data are streamed to a secure analytics backend where advanced signal‑processing algorithms generate actionable reports that can be exported to standard manufacturing execution systems.
Target Audience
Primary customers are quantum chip fabs and R&D labs that fabricate superconducting or spin‑based qubits, as well as quality‑assurance teams seeking precise defect diagnostics to improve yield and reliability.
Features
- SQUID‑on‑tip sensor with sub‑100 nm spatial resolution and pico‑Tesla magnetic sensitivity operating down to 10 mK
- Non‑contact, cryogenic‑compatible scanning head that integrates with standard wafer carriers and probe stations
- Automated defect detection pipeline employing wavelet‑based denoising and machine‑learning classification of failure modes
- Real‑time data acquisition and visualization via a web‑based dashboard with customizable heat‑maps and line‑cut analyses
- Export of measurement data in industry‑standard formats (HDF5, JSON) and API hooks for MES/ERP integration
- Modular hardware adapters supporting superconducting qubits, spin qubits, and hybrid quantum devices
- Secure cloud storage with end‑to‑end encryption and role‑based access controls for collaborative analysis