QDI Systems develops and manufactures quantum‑dot image sensors for X‑ray and short‑wave infrared (SWIR) applications. Their sensors replace traditional photodetectors with colloidal quantum dots, delivering higher quantum efficiency, low dark current, and a thin, lightweight architecture that improves image quality while reducing system size and cost. They provide custom sensor designs and integration support for medical, industrial, security and research imaging equipment.
Funding
$6.9M raised to dateRaised to date based on public sources. This may differ from the amount the company actually raised and is based only on what is publicly available on the internet.
NNFounders
Product
Problem
Conventional X‑ray and short‑wave infrared (SWIR) imaging sensors often suffer from limited quantum efficiency, high noise, and bulky optics, which restrict image quality, increase system cost, and hinder adoption in medical, industrial, and security applications.
Solution
QDI Systems develops and manufactures quantum‑dot image sensors that replace traditional semiconductor photodetectors in both X‑ray and SWIR domains. By embedding colloidal quantum dots directly onto the sensor substrate, the devices achieve higher photon absorption across a broad wavelength range while maintaining low dark current. The technology enables thinner, lighter imaging modules with improved signal‑to‑noise ratios, allowing manufacturers to build more compact and cost‑effective cameras and detectors. QDI offers custom‑tailored sensor designs and integration support, helping partners bring next‑generation imaging products to market faster.
Target Audience
Primary customers are manufacturers of medical imaging equipment (e.g., mammography and CT systems), industrial inspection and quality‑control cameras, security and night‑vision devices, and research institutions requiring high‑performance X‑ray or SWIR sensors.
Features
- Quantum‑dot photodetector layers tuned for optimal sensitivity in X‑ray (up to 150 keV) and SWIR (900‑2500 nm) spectra
- High quantum efficiency combined with low dark current for superior image quality in low‑light conditions
- Thin, lightweight sensor architecture that reduces system size and simplifies optical design
- Scalable wafer‑level manufacturing process compatible with standard CMOS back‑end integration
- Custom wavelength engineering and packaging options to meet specific application requirements
- Comprehensive technical support for sensor integration, calibration, and firmware development