QS
Quantum Diamonds provides quantum‑based metrology tools for semiconductor testing, delivering nanometer‑scale, non‑destructive defect imaging. Their platform offers single‑chip, full‑wafer, and inline wafer‑mapping solutions that combine high resolution, wide‑field coverage, and rapid measurement speeds. The technology enables manufacturers to perform failure analysis, process control, and advanced packaging inspection without damaging the chips.
Updated 2 months ago
Funding
Funding not disclosed
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Founders
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Product
Features
- Quantum Diamonds develops a next-generation metrology platform utilizing quantum sensing for semiconductor testing and failure analysis. This technology provides non-destructive, high-resolution imaging of chip defects at the nano-scale, even through advanced packaging layers. The platform offers solutions for in-lab, in-fab, and in-line applications, enabling faster defect localization and real-time process control in chipmaking.