Pro-2000

Pro-2000 designs and manufactures specialized inspection equipment for the semiconductor and display industries. Their solutions include probe cards, pin boards, and test jigs that enable precise quality control for components like semiconductors and OLED panels.

Updated 2 months ago

Funding

Funding not disclosed

Funding rounds are not available yet.

Founders

Founder details are not available yet.

Product

Problem

The semiconductor and display industries require precise and reliable testing equipment to ensure the quality and performance of electronic components. Traditional testing methods can be complex and may not always meet the rigorous demands of advanced manufacturing processes.

Solution

Pro-2000 provides specialized inspection equipment designed for the semiconductor and display manufacturing sectors. Their product portfolio includes probe cards, pin boards, and various test jigs that facilitate accurate and efficient quality control. By focusing on precision engineering and advanced materials, Pro-2000 aims to support manufacturers in achieving higher yields and product reliability. The company's commitment to research and development ensures their solutions remain aligned with the evolving technological landscape of these industries.

Target Audience

Manufacturers in the semiconductor and display industries, including those involved in OLED and LCD panel production, as well as research and development facilities requiring specialized testing apparatus.

Features

Probe cards for semiconductor testing, including DDI, ASIC, SOC, and PMIC applications.
Pin boards and ICP (In-Chamber Probe) solutions for OLED panel defect inspection.
Aging pallets for OLED mobile panel luminance stabilization and defect analysis.
Array units for TFT deposition process current testing, detecting open/short circuits and leakage currents.
Auto Probe Units (APU) designed for testing various panel sizes, from medium to ultra-large, on a single platform.
Carrier jigs for OLED module final inspection, including Mura, optical correction, and viewing angle tests.
Manual test jigs for benchtop testing and portable, on-site inspection in confined spaces.
ICP alignment jigs for on-site probe alignment and testing without glass panel removal.
Development of advanced probe-related technologies, including multi-layer ceramic substrates for probe cards and reliability testing equipment.
Participation in national R&D projects focused on ICP manufacturing technology for pad pitches below 100µm.
Holding intellectual property for film-type pin boards, probe blocks for panel testing, and probe cards for wafer testing.