Kitov develops an AI-based visual inspection platform that automates the detection of defects in complex manufactured parts using CAD-based planning and 3D computer vision. This technology addresses the inefficiencies of manual inspections, significantly reducing error rates and improving quality control across various industries, including automotive, aerospace, and medical devices.
Funding
Funding not disclosed
Founders
Product
Problem
Manual visual inspection of manufactured parts is prone to errors and inefficiencies, especially for complex geometries and intricate designs. This can lead to undetected defects, compromising product quality and increasing costs in industries that require high precision and reliability.
Solution
Kitov provides an AI-powered visual inspection platform that automates defect detection in manufactured parts. The platform uses CAD-based planning and 3D computer vision to identify flaws with greater accuracy and speed than manual inspection. Machine builders, system integrators, and manufacturers can integrate the software with new or existing production processes, combining it with best-in-breed detectors and hardware components. The system employs a hybrid AI model, combining AI with classical 3D computer vision, to detect cosmetic defects like scratches and discoloration, as well as mechanical defects such as defective screws or bent pins.
Target Audience
The primary customers are machine builders, system integrators, and manufacturers in industries such as automotive, aerospace, medical devices, and electronics, who require automated visual inspection solutions for quality control.
Features
- Automated CAD-based inspection planning for complex parts
- AI-powered defect detection for cosmetic and mechanical flaws
- Integration with existing production lines and hardware components
- Support for 3D metrology
- Hybrid AI model combining AI and classical 3D computer vision
- Self-learning capabilities to reduce inspection errors
- Customizable for a range of applications, including inspection and metrology
- Module licensing options available