Holoway develops precision measurement equipment utilizing proprietary digital holography technology to capture and analyze wavefront information from holograms. This technology enables large-area, one-shot, non-destructive measurements at the nanometer scale, addressing the need for high-accuracy assessments in advanced manufacturing sectors such as aerospace and semiconductors.
Funding
Funding not disclosed
Founders
Product
Problem
In advanced manufacturing, particularly in aerospace and semiconductor industries, there's a growing need for high-accuracy assessment of large-area surfaces. Traditional measurement techniques often struggle to provide non-destructive, nanometer-scale measurements in a single shot, hindering efficient quality control and process optimization.
Solution
Holoway provides precision measurement equipment leveraging proprietary digital holography technology to capture and analyze wavefront information from holograms. This enables large-area, one-shot, non-destructive measurements at the nanometer scale, overcoming limitations of conventional methods that rely on contact or multiple scans. Their technology eliminates the need for focusing and reference bases, achieving high-speed measurements without causing damage to the sample. Holoway's solutions cater to diverse needs, from laboratory experiments and offline quality control to inline and in-process monitoring, offering a novel approach to precision metrology.
Target Audience
The primary customers are manufacturers in advanced technology industries such as aerospace and semiconductors, as well as research institutions requiring high-precision surface metrology.
Features
- Standalone system for flatness and thickness measurement
- Achieves "large-area" x "one-shot" x "nanometer-order" measurement capabilities
- Overcomes accuracy limitations associated with imaging lenses and reference substrates
- Enables non-destructive, non-contact, and non-erosive measurements
- Realizes high-speed measurement without the need for focusing