DRTEM provides advanced imaging cameras and detectors for scanning and transmission electron microscopy, offering high‑resolution CMOS sensors and event‑driven hybrid pixel detectors that support 4D‑STEM and ptychography. Their products are AI‑ready, compatible with microscopes from any vendor—including legacy models—and can be customized as upgrades for existing SEM systems. By delivering cutting‑edge technology at affordable prices, DRTEM enables labs worldwide to enhance research imaging capabilities.
Funding
Funding not disclosed
Founders
Product
Problem
Electron microscopy laboratories often rely on expensive, vendor‑specific imaging cameras that may be incompatible with older instruments, limiting access to high‑resolution and in‑situ imaging capabilities. The lack of affordable, AI‑ready detectors hampers advanced techniques such as 4D‑STEM and ptychography, especially for labs with mixed or legacy equipment.
Solution
DRTEM supplies modular CMOS cameras for transmission electron microscopy (TEM) and event‑driven hybrid pixel detectors for 4D‑STEM in both TEM and scanning electron microscopy (SEM). Their Baiyun CMOS line delivers up to 16 megapixels (4k × 4k) with high‑speed readout, while the Huangshan detectors provide 256 × 256 pixel arrays with dwell times as short as 0.5 µs, supporting a wide voltage range (5‑30 kV for SEM, 30‑300 kV for TEM) and ptychography workflows. All products are designed to interface with microscopes from any vendor, including instruments up to 20 years old, and incorporate AI‑ready features for real‑time image analysis. DRTEM’s global sales and service network, anchored by a Singapore office and local distributors, ensures responsive support and easy integration across research facilities worldwide.
Target Audience
Primary customers are research laboratories, university microscopy cores, and industrial R&D facilities that require high‑performance TEM or SEM imaging and advanced 4D‑STEM or ptychography capabilities.
Features
- Baiyun CMOS TEM camera offering 4 MP, 9 MP, and 16 MP (4k × 4k) resolutions with high‑speed readout and modular design
- AI‑ready firmware enabling on‑camera processing for high‑resolution and in‑situ imaging applications
- Huangshan hybrid pixel detector for 4D‑STEM in TEM: 256 × 256 pixels, 55 µm pitch, dwell times down to 0.5 µs, compatible with 30‑300 kV instruments
- Huangshan detector for 4D‑STEM in SEM: same pixel array optimized for 5‑30 kV, available as custom upgrades for any SEM vendor or bundled with CIQTEK FE‑SEM systems
- Event‑driven, high‑speed data acquisition supporting real‑time ptychography and advanced diffraction techniques
- Full compatibility with microscopes from all major vendors, including legacy models up to two decades old
- Worldwide sales and service infrastructure with local distributors in the US, UK, Spain, Portugal, Australia, and New Zealand