PVA offers an inline hyperspectral vision system that non‑destructively inspects large‑area thin films and coated surfaces in real time. By capturing a full hyperspectral data cube and applying machine‑learning analytics, the platform delivers quantitative measurements of film thickness, composition, crystallinity, roughness and surface cleanliness, enabling immediate process adjustments and automated quality control for semiconductor, energy, aerospace, automotive and medical manufacturers.
Funding
Funding not disclosed
Founders
Product
Problem
Manufacturers of thin‑film and coated products lack fast, non‑destructive methods to monitor layer thickness, composition, crystallinity, homogeneity and surface cleanliness across large areas in real time. Conventional point‑probe techniques (e.g., XPS, AES) are slow, require contact and cannot be integrated into production lines.
Solution
Hyperspectral Vision provides an inline metrology system that captures a full hyperspectral data cube of the inspected surface. Advanced machine‑learning algorithms process the hypercube to extract quantitative metrics such as film thickness, material composition, phase distribution, surface roughness and residue levels. The system delivers real‑time, non‑contact results without interrupting production, enabling immediate process adjustments and reducing reject rates. Data are presented through a user‑friendly interface and can be fed into existing manufacturing execution systems for automated quality control.
Target Audience
Primary customers are semiconductor, energy, aerospace‑defense, automotive and medical manufacturers that require high‑throughput quality control of thin‑film deposition, surface modification and cleaning processes.
Features
- High‑speed hyperspectral imaging hardware that records a 3‑D hypercube (spatial × spectral) of the entire sample area
- Machine‑learning analytics pipeline that converts spectral data into thickness, composition, crystallinity and roughness measurements
- Non‑contact, non‑destructive inspection suitable for in‑line deployment on large‑area coating lines
- Real‑time reporting of layer uniformity, surface wettability, adsorption degree and cleaning residue detection
- Integration hooks for manufacturing execution systems and process control feedback loops
- Scalable software platform supporting multiple industry standards and custom analysis models