ASSET InterTech provides integrated hardware and software solutions for embedded system debug, trace, and test. Their platforms enable engineers to validate hardware-firmware integration, characterize SoCs and FPGAs, and enhance manufacturing test coverage, leading to faster development cycles and improved product quality.
Funding
Funding not disclosed
Founders
Product
Problem
Embedded system development and manufacturing face challenges in efficiently debugging hardware/firmware interactions, characterizing complex System-on-Chips (SoCs) and FPGAs, and ensuring comprehensive manufacturing test coverage. Traditional methods often require specialized, time-consuming setups and lack the deep visibility needed to diagnose intricate issues across diverse architectures.
Solution
ASSET InterTech provides integrated hardware and software solutions designed to streamline embedded system debug, trace, and test processes. Their platforms offer engineers advanced capabilities for validating hardware-firmware integration, characterizing SoCs and FPGAs, and enhancing manufacturing test efficacy. By leveraging a unified approach, ASSET enables faster development cycles and improved product quality from initial design through to production. The company's offerings facilitate detailed analysis of system behavior, allowing for the identification and resolution of complex issues that impact performance and reliability.
Target Audience
The primary target audience includes hardware and firmware engineers, design-for-test (DFT) engineers, validation engineers, and manufacturing test engineers involved in the development and production of embedded systems, SoCs, and complex electronic devices.
Features
- **SourcePoint:** A unified debug and trace platform supporting ARM and Intel architectures, providing deep visibility into multi-threaded and multi-core embedded software environments.
- **ScanWorks:** A comprehensive platform for embedded instruments, including:
- **Boundary-Scan Test (BST):** Automates test development for interconnects and device programming, supporting various deployment phases from design to repair.
- **Processor-based Functional Test (PFT):** Utilizes the SoC's CPU and On-Chip Memory (OCM) for testing and programming, reducing reliance on external test access.
- **DDR Tuning, Calibration & Test (PFTDDR):** Simplifies and accelerates the optimization of DDR memory systems for improved performance and reliability.
- **IJTAG Test (IEEE 1687):** Enables access and control of embedded instruments within SoCs using standardized ICL and PDL files for debug and test.
- **Embedded Diagnostics:** Facilitates deep-level debugging of hardware, firmware, and software faults in complex systems.
- **Arium Run-Control Probes:** Hardware debug probes optimized for Intel and AMD processor families, offering real-time debugging and trace capabilities.
- **Flexible Licensing:** Cost-efficient and agile licensing models for ScanWorks tools, allowing deployment of specific features across design, manufacturing, and repair environments.
- **Model-Based Test Development:** Utilizes extensive device model libraries for automated test pattern generation, increasing productivity and test coverage.
- **Parallel Test and Programming:** Supports simultaneous testing and programming of multiple units under test (UUTs) to maximize production throughput.
- **Integration Capabilities:** APIs and compatibility with common test executives (e.g., NI LabVIEW, TestStand) for seamless integration into existing workflows.