Advanced Spectral Technology delivers turn‑key metrology solutions that combine high‑accuracy motion control, defect inspection, and optical design across infrared, visible and UV spectra. Their product line includes manual, semi‑automatic and fully‑automatic platforms tailored for industries such as data storage, probe‑card, VCSEL, aerospace/defense, and semiconductor/MEMS, enabling precise imaging and measurement at wafer, die and chip levels.
Funding
$800K raised to dateRaised to date based on public sources. This may differ from the amount the company actually raised and is based only on what is publicly available on the internet.
Founders
Product
Problem
Manufacturers of data storage, semiconductors, VCSELs, probe cards, aerospace, and medical devices require high‑accuracy inspection, metrology, and process automation across infrared, visible, and UV spectra, but existing tools are often fragmented, limited in wavelength coverage, and lack integrated motion control and automation.
Solution
Advanced Spectral Technology (AST) provides fully configurable, turn‑key metrology platforms that combine ultra‑precise motion control, multi‑spectral imaging, and automated part handling. Customers can select from manual, semi‑automatic, or fully automated systems tailored to wafer, die, chip, or component‑level applications. The platforms integrate specialized optics, illumination, and high‑resolution cameras for IR, visible, and UV imaging, enabling defect detection, critical‑dimension measurement, overlay metrology, and alignment/bonding verification. AST’s ScopeViewer software automates measurement scripts, data acquisition, and analysis, while supporting standard factory interfaces such as SECS/GEM for seamless reporting and process control. This integrated approach reduces tool count, improves throughput, and delivers repeatable, high‑precision results across diverse manufacturing environments.
Target Audience
Primary customers are manufacturers in data storage, semiconductor and MEMS, VCSEL, probe‑card, aerospace/defense, and medical device sectors that need high‑precision, multi‑spectral inspection and metrology for development or high‑volume production.
Features
- Ultra‑high precision motion control with sub‑micron repeatability for automated wafer, die, and part handling
- Multi‑spectral imaging options (UV, visible, NIR, SWIR, MWIR) with interchangeable optics, strobing illumination, and camera configurations
- Fully configurable automation levels (manual, semi‑automatic, fully automated) including part loading, alignment, bonding, and sorting
- ScopeViewer metrology software for scripted measurement sequences, defect detection, CD/overlay analysis, and data export via SECS/GEM or other factory interfaces
- Flexible fixture and tooling designs, including custom optics mounts, motorized lens turrets, and OCR‑enabled wafer handlers
- Modular integration of additional sensors (spectrophotometers, ellipsometers, profilometers) to consolidate multiple metrology tasks in a single system
- Turn‑key turnkey delivery with ISO‑9001:2015 quality management, field service, and maintenance support