Traditional methods for measuring material properties in nanoscale manufacturing are often destructive, time-consuming, and limited to measuring a single property at a time. This makes real-time quality control and process optimization challenging, hindering the production of advanced materials in semiconductor and aerospace manufacturing.

SirenOpt provides a non-destructive, real-time measurement solution for multiple material properties using cold atmospheric plasma and physics-informed machine learning. Their PlasmaSens™ technology creates multifaceted material fingerprints instantly, enabling comprehensive material insights for enhanced quality control and optimized production processes. This approach transforms costly destructive measurements into continuous non-destructive measurements, adding measurement variety to better track a material's functional properties on the production line. SirenOpt's technology accelerates R&D, enhances product performance, and delivers higher production quality in both in-line and off-line applications.

Non-destructive measurement of multiple material properties in real-time

Cold atmospheric plasma technology for material characterization

Physics-informed machine learning for data analysis and interpretation

PlasmaSens™ platform for in-line and off-line applications

Ability to measure wafer-to-wafer, piece-to-piece, sheet-to-sheet, and roll-to-roll

Transforms measurement blind spots into rich multi-layered material insights

SirenOpt's primary customers are companies and startups in semiconductor, aerospace, lithium-ion battery, nickel-zinc battery, electronics, industrial separations, medical devices, packaging, industrial glass, and other industries involved in advanced materials manufacturing.